Test
For the storage of 15 capsule blocks in numbered cavities.
This mount which is made from aluminum is used for the mounting and tilting of samples from 0 – 90 degrees as well as for SEM investigation with small working distances. The mount is marked for 30, 45, 70 and 90 degress. The table measures 11 x 11 mm (0.46" x0.46")and the overall size is 14 x 14 x12.7 mm
Type: Hitachi M4
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Accommodates up to 31.8 mm (1.25") diameter of a metallurgical specimen with at least 0.8 mm (1/8") clearance, pin is 3.1 mm (1/8"), depth is 8 mm (5/16")
Luer stub / blunt needle, 15ga x 0.5in (12mm). Amber. 50 sterile pouches of 5.
Very strong and rugged clear polycarbonate box to store standard pin mounts with 3.2mm (1/8"). This box is watertight, crushproof and dustproof. The strong hinges, locking clasps and soft silicone O-ring seal makes this an ideal transport, shipping and storage box for SEM samples on pin mounts. The holder insert is numbered 1-18 and accommodates all types of pin mounts form 6.4 to 50mm diameter.
Machined from solid steel and brass/nickel plated. Incorporates a stainless steel mesh top and bottom to allow for fluid exchange. Comes with two sections; each section holds 12 specimens in 12 cavities cavity measures 4.5mm(D) x 6mm(H)..
These specimen grid boxes are tools for storing or transferring cryogenic TEM specimen grids. Features four diamond shaped slots. Non-static clear covershield held in place with stainless steel screw, which is tapped in the center of the box. Box fits the FEI Vitrobot™, Gatan 626™, Gatan 3500™.
Color: White/Blue
This 62 mm in diameter multi pin holder is designed to save time. It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to twelve standard 12.7 mm (1/2") pin stubs
Type: Hitachi M4
This thin section holder is made from vacuum grade aluminum with copper clips and brass screws . The unit measures 51x32x8 mm and holds either standard thin sections of 47 x 27 mm or smaller or larger thin sections. Smallest size would be 40x20 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Type: 9.5mm Pin
This 35 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen. It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to six standard 12.7 mm (1/2") pin stubs.
Type: Hitachi M4
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges Pitch 700, W-coated Photoresist on Si. Use contact or TappingMode.
Mount: AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: Choose a mount
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For AFM, use in contact, intermittent contact (TappingMode) and other modes with image sizes from 100 to 3000 nm.
EMS Metallurgical Microscopes use long working distance objectives and reflected or incident illumination to deliver sharp, high contrast images of solid specimens. The large collector lens and light path combine with the specifically positioned diaphragms to allow more light for brighter images. A polarizer and analyzer and color filters are built-in to enhance observation. The Inverted model utilizes incident illumination for over size samples. The trinocular head allows for quick and easy attachment of cameras for documentation.